Development of liquid-environment frequency modulation atomic force microscope with low noise deflection sensor for cantilevers of various dimensions

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Abstract
We have developed a liquid-environment frequency modulation atomic force microscope (FM-AFM) with a low noise deflection sensor for a wide range of cantilevers with different dimensions. A simple yet accurate equation describing the theoretical limit of the optical beam deflection method in air and liquid is presented. Based on the equation, we have designed a low noise deflection sensor. Replaceable microscope objective lenses are utilized for providing a high magnification optical view (resolution: <3μm) as well as for focusing a laser beam (laser spot size: ∼10μm). Even for a broad range of cantilevers with lengths from 35to125μm, the sensor provides deflection noise densities of less than 11fm∕Hz in air and 16fm∕Hz in water. In particular, a cantilever with a length of 50μm gives the minimum deflection noise density of 5.7fm∕Hz in air and 7.3fm∕Hz in water. True atomic resolution of the developed FM-AFM is demonstrated by imaging mica in water.

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