Microsatellite Markers Associated with Spot Blotch Resistance in Spring Wheat
Authors:
- 16 May 2007
- journal article
- Published by Wiley in Journal of Phytopathology
- Vol. 155 (5) , 316-319
Abstract
No abstract availableKeywords
This publication has 12 references indexed in Scilit:
- Spot Blotch Continues to Cause Substantial Grain Yield Reductions under Resource‐limited Farming ConditionsJournal of Phytopathology, 2006
- Progress in Wheat Resistance to Spot Blotch in BangladeshJournal of Phytopathology, 2006
- Epidemiology of Foliar Blights (Spot Blotch and Tan Spot) of Wheat in the Plains Bordering the HimalayasPhytopathology®, 2005
- Helminthosporium leaf blight resistance and agronomic performance of wheat genotypes across warm regions of South AsiaPlant Breeding, 2004
- Recessive genes controlling resistance to Helminthosporium leaf blight in synthetic hexaploid wheatPlant Breeding, 2004
- A high-density microsatellite consensus map for bread wheat (Triticum aestivum L.)Theoretical and Applied Genetics, 2004
- Inheritance of resistance to spot blotch caused by Bipolaris sorokiniana in spring wheatPlant Breeding, 2004
- Controlling Foliar Blights of Wheat in the Rice-Wheat Systems of AsiaPlant Disease, 2004
- Combining ability analysis of resistance to Helminthosporium leaf blight in spring wheatEuphytica, 2004
- Inheritance of Slow‐Rusting Resistance to Leaf Rust in WheatCrop Science, 1992