Convenient Preparation of High-Quality Specimens for Annealing Experiments in the Transmission Electron Microscope
- 5 November 2014
- journal article
- research article
- Published by Oxford University Press (OUP) in Microscopy and Microanalysis
- Vol. 20 (6) , 1638-1645
Abstract
A procedure based on focused ion beam milling and in situ lift-out is introduced for the preparation of high-quality specimens for in situ annealing experiments in the transmission electron microscope. The procedure allows an electron-transparent lamella to be cleaned directly on a heating chip using a low ion energy and back-side milling in order to minimize redeposition and damage. The approach is illustrated through the preparation of an Al–Mn–Fe complex metallic alloy specimen.Keywords
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