Evaluating Cross-Plane Acquisitions for Volume Process Tomography in the Laplacian Regime
Authors:
- Rafiul K. RaselRRRafiul K. Rasel
- Daniel Ospina AceroDADaniel Ospina Acero
- Fernando L. TeixeiraFTFernando L. Teixeira
- Qussai M. MarashdehQMQussai M. Marashdeh
- 1 January 2019
- conference paper
- Published by Institute of Electrical and Electronics Engineers (IEEE)
Abstract
No abstract availableThis publication has 16 references indexed in Scilit:
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