Measurement of the correlation between the specular reflectance and surface roughness of Ag films
Authors:
- A. J. BraundmeierABA. J. Braundmeier
- 15 July 1976
- journal article
- research article
- Published by American Physical Society (APS) in Physical Review B
- Vol. 14 (2) , 479-483
Abstract
We present here an empirical relationship between the root-mean-square surface roughness and the loss in specular reflectance at the wavelength of 3500 Å for silver films having surface roughness between 5 and 35 Å. Films deposited on super-smooth substrates and films whose roughness was purposely enhanced were used for these measurements. From these data and the Elson-Ritchie theory the correlation lengths for our films were determined.Keywords
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