Implementing Realistic Heavy Ion Tracks in a SEE Prediction Tool: Comparison Between Different Approaches
- 2 March 2012
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Nuclear Science
- Vol. 59 (4) , 950-957
Abstract
Different radial ionization profiles modeling approaches are compared for the energy deposition representation in a single event effects (SEE) prediction tool. The total SEU cross-section calculated with the different approaches is compared for different SOI and bulk technologies, along with the multiple bit upset (MBU) prediction. A “refined average” approach is identified as a good trade-off for implementation in an engineer SEE prediction tool, taking into account sufficiently detailed physics, without asking for too much computer resources.Keywords
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