Calculation of Noise Intensity in the Frequency Demodulation for Atomic Force Microscopy
Authors:
- Yukio HasegawaYHYukio Hasegawa
- Toyoaki EguchiTEToyoaki Eguchi
- Toshu AnTAToshu An
- Masanori OnoMOMasanori Ono
- Kotone AkiyamaKAKotone Akiyama
- Toshio SakuraiTSToshio Sakurai
- 6 February 2004
- journal article
- Published by IOP Publishing in Japanese Journal of Applied Physics
- Vol. 43 (No. 2B) , L303-L305