Electron Mobility, Conductivity, and Superconductivity near the Metal-Insulator Transition

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Abstract
The disorder parameter kFl for amorphous InOx is measured by a novel application of the surface electric field effect and is varied by thermal annealing. The normal-state conductivity and superconducting Tc both vary as (kFl)−2 and critical disorder occurs at kFl≈312, as a result of Anderson localization in this low—carrier-density material.

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