Emissivity Measurements on Metallic Surfaces with Various Degrees of Roughness: A Comparison of Laser Polarimetry and Integrating Sphere Reflectometry

This publication has 14 references indexed in Scilit:

• Ellipsometry in the Study of Dynamic Material Properties
  International Journal of Thermophysics, 2002
• Microsecond Laser Polarimetry for Emissivity Measurements on Liquid Metals at High Temperatures—Application to Tantalum
  International Journal of Thermophysics, 2002
• Thermophysical Property Measurements on Niobium and Titanium by a Microsecond-Resolution Pulse-Heating Technique Using High-Speed Laser Polarimetry and Radiation Thermometry
  International Journal of Thermophysics, 2002
• Application of a high speed, low temperature infrared pyrometer in pulsed power experiments
  Review of Scientific Instruments, 2001
• Containerless Processing in Space—Thermophysical Property Measurements Using Electromagnetic Levitation
  International Journal of Thermophysics, 2001
• Interpretation of integrating sphere signal output for non-Lambertian samples
  Applied Optics, 1988
• Construction, calibration, and testing of a four-detector photopolarimeter
  Review of Scientific Instruments, 1988
• Correction methods for integrating‐sphere measurement of hemispherical reflectance
  Color Research & Application, 1986
• Division-of-amplitude Photopolarimeter (DOAP) for the Simultaneous Measurement of All Four Stokes Parameters of Light
  Optica Acta: International Journal of Optics, 1982
• Errors in Reflectometry
  Journal of the Optical Society of America, 1935