Passive-intermodulation analysis between rough circular waveguide flanges using Weibull distribution
Authors:
- 1 April 2010
- conference paper
- Published by Institute of Electrical and Electronics Engineers (IEEE)
- No. 21627673,p. 1442-1445
Abstract
In this paper, the Weibull distribution is employed to characterise the surface topography in the analysis of the passive intermodulation (PIM) between rough circular waveguide flanges, where the PIM level as a function of different system parameters such as the applied pressure, roughness, layer thickness and the power ratio has been developed assuming that the PIM level for a particular set of parameters is known. The proposed method is more significant when the contact surface needs to be described by parameters like the skewness or the kurtosis.Keywords
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