effects of ion bombardment at high temperature on the microstructure of Y2O3
Authors:
- 1 January 1977
- journal article
- research article
- Published by Taylor & Francis in Radiation Effects
- Vol. 31 (3) , 181-184
Abstract
An important aspect of displacement-induced radiation damage of ceramic materials that has received only occasional attention is the characterization of the microstructure by transmission-electron microscopy.1 The emphasis of the majority of the research has been on measurements of macroscopic properties such as density changes, mechanical strength, and electrical and thermal conductivity,2 also, some work has been performed on point defects, using such techniques as electron-spin resonance, electrical-resistivity measurements, and optical spectroscopy.2,3 Characterization of the radiation-induced defect microstructure should yield important complementary information for macroscopic as well as point-defect measurements.Keywords
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