Two-dimensional x-ray photoelectron diffraction measurements by a retarding field-type analyzer

This publication has 10 references indexed in Scilit:

• Design and performance of a UHV compatible soft X-ray double crystal monochromator at the proton factory
  Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment, 1986
• Experimental and Theoretical Two-Dimensional X-Ray Photoelectron Diffraction Patterns from GaAs(001) Surface
  Japanese Journal of Applied Physics, 1985
• Direct observation system of electron angular distributions for the measurements of X-ray photoelectron diffraction patterns.
  Journal of the Spectroscopical Society of Japan, 1985
• A display-type analyzer with an image-processing system for angle-resolved photoelectron spectroscopy
  Nuclear Instruments and Methods in Physics Research, 1983
• Direct Atomic Site Determination of Foreign Atoms in a Crystal Surface Layer by X-Ray Photoelectron Diffraction
  Japanese Journal of Applied Physics, 1981
• Photoelectron diffraction effects in XPS angular distributions from GaAs(110) and Ge(110) single crystals
  Journal of Electron Spectroscopy and Related Phenomena, 1981
• Structural and Chemical State Analysis of the Heat-Treated Au/GaSb(110) Interface by Means of Angle-Resolved X-Ray Photoelectron Spectroscopy (ARXPS)
  Japanese Journal of Applied Physics, 1980
• Estimation of Surface Crystal Regularity by Utilizing X-Ray Photoelectron Diffraction (XPED) Effects
  Japanese Journal of Applied Physics, 1980
• An ellipsoidal mirror display analyzer system for electron energy and angular measurements
  Nuclear Instruments and Methods, 1980
• Vidicon-camera parallel-detection system for angle-resolved electron spectroscopy
  Review of Scientific Instruments, 1979