Determination of microwave dielectric constant by two microstrip line method combined with EM simulation
- 29 August 2006
- journal article
- research article
- Published by Wiley in Microwave and Optical Technology Letters
- Vol. 48 (11) , 2199-2201
Abstract
This paper presents a modified procedure to determine the microwave dielectric constant of substrate by two microstrip line method combined with EM simulation. The dielectric constant of substrate is mapped from the measured transmission phase with those of EM simulation, instead of using the closed form equations between the effective dielectric constant and dielectric constant. A tested example of dielectric constant of FR4 substrate is experimented and extracted to verify the proposed procedure. © 2006 Wiley Periodicals, Inc. Microwave Opt Technol Lett 48: 2199–2201, 2006; Published online in Wiley InterScience (www.interscience.wiley.com). DOI 10.1002/mop.21936Keywords
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