Extremely low-noise potentiometry with a scanning tunneling microscope
Authors:
- 1 March 1989
- journal article
- conference paper
- Published by AIP Publishing in Review of Scientific Instruments
- Vol. 60 (3) , 301-305
Abstract
Novel ac biasing and detection techniques have been developed to allow a scanning tunneling microscope (STM) to measure spatial variations in electric potential on metallic surfaces with sub-μV sensitivity. When implemented with a room-temperature STM operating with minimal electrical shielding and no vibration isolation, the voltage sensitivity was limited by the thermal (Johnson) noise of the tunneling resistance.Keywords
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