Design for Testability—A Survey
Authors:
- Kenneth P ParkerKPKenneth P Parker
- 1 January 1982
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Computers
- Vol. C-31 (1) , 2-15
Abstract
This paper discusses the basics of design for testability. A short review of testing is given along with some reasons why one should test. The different techniques of design for testability are discussed in detail. These include techniques which can be applied to today's technologies and techniques which have been recently introduced and will soon appear in new designs.Keywords
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