A revised expression for signal/noise ratio in EELS
Author:
- R.F. EgertonRER.F. Egerton
- 1 January 1982
- journal article
- other
- Published by Elsevier in Ultramicroscopy
- Vol. 9 (4) , 387-390
Abstract
No abstract availableThis publication has 2 references indexed in Scilit:
- Electron energy loss spectroscopy: Detectable limits for elemental analysisUltramicroscopy, 1980
- The microanalysis of light elements using transmitted energy loss electronsUltramicroscopy, 1975