Analysis of the electrical parameters, frequency, and voltage dependence of surface states and series resistance in Au/n-Si Schottky diodes (SDs) with (Fe2O3) interlayer

This publication has 29 references indexed in Scilit:

• Electrical properties, conduction mechanisms, and voltage dependent curves of interface traps, series resistance in Au/(Sn:Fe2O3)/n-Si structures using impedance measurements
  Journal of Materials Science: Materials in Electronics, 2025
• Surface states and series resistance effects in Au/(HgS-PVA)/n-Si capacitors
  Journal of Materials Science: Materials in Electronics, 2025
• A detailed analysis of electrical parameters and energy dependence of interface Traps in Au-(Co:PVA)-nSi-Al structure via impedance measurements
  Journal of Materials Science: Materials in Electronics, 2025
• Frequency-dependent physical parameters, the voltage-dependent profile of surface traps, and their lifetime of Au/(ZnCdS-GO:PVP)/n-Si structures by using the conductance method
  Journal of Materials Science: Materials in Electronics, 2024
• Electrical Characterization of Semiconductors: I–V, C–V and Hall Measurements
  2023
• The investigation of effects of (Fe2O4-PVP) organic-layer, surface states, and series resistance on the electrical characteristics and the sources of them
  Journal of Materials Science: Materials in Electronics, 2019
• A comparison of electrical parameters of Au/n-Si and Au/(CoSO4–PVP)/n-Si structures (SBDs) to determine the effect of (CoSO4–PVP) organic interlayer at room temperature
  Journal of Materials Science: Materials in Electronics, 2019
• Electrical Properties and Current Transport Mechanisms of the Au/n-GaN Schottky Structure with Solution- Processed High-k BaTiO3 Interlayer
  Journal of Electronic Materials, 2014
• Physics of Semiconductor Devices
  2006
• Metal-Semiconductor Schottky Barrier Junctions and Their Applications
  1984