Raman spectroscopic investigation of film thickness
Authors:
- G. RegdonGRG. Regdon
- K. Pintye-HódiKPK. Pintye-Hódi
- 1 October 2009
- journal article
- research article
- Published by Elsevier in Polymer Testing
- Vol. 28 (7) , 770-772
Abstract
No abstract availableKeywords
This publication has 4 references indexed in Scilit:
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- Application of process analytical technology in tablet process development using NIR spectroscopy: Blend uniformity, content uniformity and coating thickness measurementsInternational Journal of Pharmaceutics, 2008
- Nondestructive Analysis of Tablet Coating Thicknesses Using Terahertz Pulsed ImagingJournal of Pharmaceutical Sciences, 2005
- Determination of film thickness and refractive index by interferometryPolymer Testing, 2004