Homogeneity characterization of lattice spacing of silicon single crystals by a self-referenced lattice comparator
Authors:
- H FujimotoHFH Fujimoto
- A WasedaAWA Waseda
- X W ZhangXZX W Zhang
- 22 March 2011
- journal article
- Published by IOP Publishing in Metrologia
- Vol. 48 (2) , S55-S61
Abstract
No abstract availableKeywords
This publication has 9 references indexed in Scilit:
- Counting the atoms in a28Si crystal for a new kilogram definitionMetrologia, 2011
- A Silicon d-spacing Mapping Measurement System With Resolution of 10[sup −9]AIP Conference Proceedings, 2010
- Present State of the Avogadro Constant Determination From Silicon Crystals With Natural Isotopic CompositionsIEEE Transactions on Instrumentation and Measurement, 2005
- Measurement repetitions of the Si (220) lattice spacingMetrologia, 2004
- Measurement repetitions of the Si(220) lattice spacingMetrologia, 2003
- Determination of the Avogadro constant via the silicon routeMetrologia, 2003
- Lattice spacing mapping in large silicon ingot using high resolution lattice comparator2003
- A novel lattice-spacing comparator with resolution of 10−8Journal of Applied Crystallography, 2003
- Progress in the measurement of lattice spacing d(220) of siliconIEEE Transactions on Instrumentation and Measurement, 1997