Structure, stability, and electronic properties of and interfaces
Authors:
- 1 October 2007
- journal article
- research article
- Published by American Physical Society (APS) in Physical Review B
- Vol. 76 (16) , 165103
Abstract
Density functional theory by means of the mixed-basis pseudopotential method was employed to carry out electronic-structure calculations of interfaces in and perovskite heterophase systems. The main objective of the work is to investigate the influence of different structural and chemical terminations of the interfaces on their electronic and adhesive properties. The investigated supercells therefore include not only interfaces with a regular perovskite stacking but also interfaces with planar stacking-fault-like defects of Ruddlesden-Popper and Magneli types. Stability of interfaces is assessed by calculating rigid and relaxed works of separation. Band offsets and Schottky barriers are determined for the insulator/insulator and the insulator/conductor systems, respectively.
Keywords
This publication has 65 references indexed in Scilit:
- Tunable Quasi-Two-Dimensional Electron Gases in Oxide HeterostructuresScience, 2006
- Science and technology of thin films and interfacial layers in ferroelectric and high-dielectric constant heterostructures and application to devicesJournal of Applied Physics, 2006
- Electronically coupled complementary interfaces between perovskite band insulatorsNature Materials, 2006
- Why some interfaces cannot be sharpNature Materials, 2006
- High dielectric constant gate oxides for metal oxide Si transistorsReports on Progress in Physics, 2005
- Physics of thin-film ferroelectric oxidesReviews of Modern Physics, 2005
- A high-mobility electron gas at the LaAlO3/SrTiO3 heterointerfaceNature, 2004
- Alternative dielectrics to silicon dioxide for memory and logic devicesNature, 2000
- Electroceramic materialsActa Materialia, 2000
- (Ba,Sr)TiO3 dielectrics for future stacked- capacitor DRAMIBM Journal of Research and Development, 1999