A data-driven method for anomaly detection and aging model parameter estimation of capacitors based on condition monitoring
Authors:
- Chunlin LvCLChunlin Lv
- Jinjun LiuJLJinjun Liu
- Yan ZhangYZYan Zhang
- 25 September 2022
- journal article
- research article
- Published by Elsevier in Microelectronics Reliability
- Vol. 138
Abstract
No abstract availableKeywords
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