Cross sections for 165° backscattering of 2.0–9.0 MeV 4He ions from nitrogen

This publication has 10 references indexed in Scilit:

• Non-Rutherford backscattering analysis of nitrogen content in titanium substrates
  Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 1993
• Measurement of N in High Z Substrate Using Non-Rutherford Backscattering
  Chinese Physics Letters, 1992
• Nitrogen profiling in nitride films and nitrogen-implanted samples using the (α, α) (α, ) reactions at 6 MeV incident energy
  Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 1992
• Reduced wear and cladding performances of several materials by nitrogen ion implantation
  Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 1991
• Effects of oxygen in TiNx on the diffusion of Cu in Cu/TiN/Al and Cu/TiNx/Si structures
  Applied Physics Letters, 1991
• Formation of buried and surface CoSi2 layers by ion implantation
  Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 1990
• Non-Rutherford elastic backscattering for light element cross section enhancement
  Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 1989
• Analysis of tin films using alpha resonant scattering
  Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 1989
• Energy Levels ofF18
  Physical Review B, 1958
• Energy Levels in ${\mathrm{F}}^{18}$ from the ${\mathrm{N}}^{14}(\alpha , \alpha ){\mathrm{N}}^{14}$ and ${\mathrm{N}}^{14}(\alpha , p){\mathrm{O}}^{17}$ Reactions
  Physical Review B, 1958