Enhanced gate-bias stress stability of organic field-effect transistors by introducing a fluorinated polymer in semiconductor/insulator ternary blends
Authors:
- Yong Jin JeongYJYong Jin Jeong
- Dong-Jin YunDYDong-Jin Yun
- Sooji NamSNSooji Nam
- Jaeyoung JangJJJaeyoung Jang
- 1 July 2019
- journal article
- research article
- Published by Elsevier in Applied Surface Science
- Vol. 481, 642-648
Abstract
No abstract availableKeywords
Funding Information
- National Research Foundation of Korea
- Ministry of Education (2018R1D1A1A02050420)
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