Matrix effects in quantitative auger analysis of dilute alloys
Authors:
- P.M. HallPHP.M. Hall
- J.M. MorabitoJMJ.M. Morabito
- 1 May 1979
- journal article
- Published by Elsevier in Surface Science
- Vol. 83 (2) , 391-405
Abstract
No abstract availableThis publication has 20 references indexed in Scilit:
- Compositional depth profiling by auger electron spectroscopyCritical Reviews in Solid State and Materials Sciences, 1978
- Quantitative approach of Auger electron spectrometrySurface Science, 1977
- Relative sensitivity factors for quantitative Auger analysis of binary alloysSurface Science, 1977
- Quantitative auger electron spectroscopy analysis of AgPd and NiPd alloysSurface Science, 1975
- Attenuation lengths of low-energy electrons in solidsSurface Science, 1974
- Quantitative analysis of light elements (nitrogen, carbon, and oxygen) in sputtered tantalum films by Auger electron spectroscopy and secondary ion mass spectrometry (SIMS)Analytical Chemistry, 1974
- The probing depth in photoemission and auger-electron spectroscopyJournal of Electron Spectroscopy and Related Phenomena, 1974
- Quantitative Auger electron spectroscopy and electron rangesSurface Science, 1972
- Electron scattering in thick targetsBritish Journal of Applied Physics, 1967
- Backscattering of Kilovolt Electrons from SolidsPhysical Review B, 1954