LATERAL NONUNIFORMITIES (LNU) OF OXIDE AND INTERFACE STATE CHARGE
Authors:
- 1 January 1978
- book chapter
- Published by Elsevier
- p. 443-448
Abstract
No abstract availableKeywords
This publication has 6 references indexed in Scilit:
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- Image forces and the behavior of mobile positive ions in silicon dioxideApplied Physics Letters, 1973
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- Dielectric breakdown induced by sodium in MOS structuresJournal of Applied Physics, 1973
- Admittance of an MOS device with interface charge inhomogeneitiesJournal of Applied Physics, 1972
- The Si-SiO2Interface - Electrical Properties as Determined by the Metal-Insulator-Silicon Conductance TechniqueBell System Technical Journal, 1967