Characterization of vertical Mo/diamond Schottky barrier diode from non-ideal I–V and C–V measurements based on MIS model
Authors:
- A. NawawiANA. Nawawi
- K.J. TsengKTK.J. Tseng
- RusliRURusli
- G.A.J. AmaratungaGAG.A.J. Amaratunga
- H. UmezawaHUH. Umezawa
- S. ShikataSSS. Shikata
- 1 May 2013
- journal article
- Published by Elsevier in Diamond and Related Materials
- Vol. 35, 1-6
Abstract
No abstract availableThis publication has 24 references indexed in Scilit:
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