Phase contrast hard x-ray microscopy with submicron resolution
- 3 November 1997
- journal article
- conference paper
- Published by AIP Publishing in Applied Physics Letters
- Vol. 71 (18) , 2557-2559
Abstract
In this letter we present a hard x-ray phase contrast microscope based on the divergent and coherent beam exiting an x-ray waveguide. It uses lensless geometrical projection to magnify spatial variations in optical path length more than 700 times. Images of a nylon fiber and a gold test pattern were obtained with a resolution of 0.14 μm in one direction. Exposure times as short as 0.1 s gave already visible contrast, opening the way to high resolution, real time studies.Keywords
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