Toward a BITE for real time MTTF estimation of capacitors

Authors:

1 January 2010

conference paper
Published by Institute of Electrical and Electronics Engineers (IEEE)

p. 437-442
DOI:10.1109/imtc.2010.5488065

Abstract

The use of an equipment able to provide a real time diagnostic of a monitored device (BITE) allows to increase reliability and to decrease costs. BITE operates on the basis of a suitable life model of the considered device that must relate time to failure with past and present stresses. Model development can be carried out by exploiting the results of a proper measurement campaign. In this paper, a study of the life model for capacitor subjected to thermal stress is performed by presenting the test system and discussing the achieved results.

Keywords

This publication has 1 reference indexed in Scilit:

The combination of electro-thermal stress, load cycling and thermal transients and its effects on the life of high voltage ac cables
IEEE Transactions on Dielectrics and Electrical Insulation, 2009