A low-energy electron point-source projection microscope not using a sharp metal tip performs well in long-range imaging
Authors:
- 1 May 2019
- journal article
- review article
- Published by Elsevier in Ultramicroscopy
- Vol. 200, 125-131
Abstract
No abstract availableKeywords
This publication has 18 references indexed in Scilit:
- Fabrication and characterization of low aberration micrometer-sized electron lensesUltramicroscopy, 2010
- A fully coherent electron beam from a noble-metal covered W(111) single-atom emitterNanotechnology, 2009
- Nanometer Resolution Holography with the Low Energy Electron Point Source MicroscopeZeitschrift für Physikalische Chemie, 2008
- Source of low-energy coherent electron beamsApplied Physics Letters, 2006
- Charge effect in point projection images of Ni nanowires and I collagen fibresJournal of Physics D: Applied Physics, 2001
- Wavefront reconstruction for in-line holograms formed by pure amplitude objectsApplied Surface Science, 1999
- Point source physics: Application to electron projection microscopy and holographyMicroscopy Microanalysis Microstructures, 1994
- Theory of the point source electron microscopeUltramicroscopy, 1992
- Holography with low-energy electronsPhysical Review Letters, 1990
- Low-energy electron and ion projection microscopyUltramicroscopy, 1989