Effect of heat treatment on chemical and electronic structure of solid SiO : An electron spectroscopy study
Authors:
- G. HollingerGHG. Hollinger
- Y. JugnetYJY. Jugnet
- Tran Minh DucTDTran Minh Duc
- 31 May 1977
- journal article
- Published by Elsevier in Solid State Communications
- Vol. 22 (5) , 277-280
Abstract
No abstract availableThis publication has 14 references indexed in Scilit:
- Electronic distribution of SiO by x-ray spectroscopyChemical Physics Letters, 1976
- Study of K emission spectra of SiO by electromicroprobeJournal of Physics C: Solid State Physics, 1976
- Phase separation in silicon oxides as seen by Auger electron spectroscopyApplied Physics Letters, 1975
- X-ray K absorption spectra of silicon in Si, SiO and SiO2Chemical Physics Letters, 1974
- Structure of Amorphous Silicon MonoxideJournal of Applied Physics, 1972
- The optical properties of evaporated silicon oxide filmsThin Solid Films, 1972
- Optical properties of non-crystalline Si, SiO, SiOx and SiO2Journal of Physics and Chemistry of Solids, 1971
- Disproportionation and Vaporization of Solid Silicon MonoxideJournal of the American Ceramic Society, 1967
- Differential thermal analysis of the Si-Sio2 systemJournal of Physics and Chemistry of Solids, 1957
- The Stability of SiO Solid and GasThe Journal of Physical Chemistry, 1954