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  1. Home
  2. Publications
  3. Ageing of Integrated Circuits
  1. Home
  2. Publications
  3. Ageing of Integrated Circuits

Ageing of Integrated Circuits

Editor:
  • BHBasel Halak
    Basel Halak
Publisher website
Google Scholar
  • 1 January 2020
    • book
    • Published by Springer Nature
    • DOI:10.1007/978-3-030-23781-3
Abstract
No abstract available
Keywords
  • ANALOG IC RELIABILITY
  • AGING EFFECTS ON INTEGRATED CIRCUITS
  • AGING-EFFECTS MITIGATION IN PROCESSOR ARCHITECTURES
  • RELIABILITY WEAROUT MECHANISMS
  • BIAS TEMPERATURE INSTABILITY
Cited by 27 articles
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