An Optimal Algorithm for Testing Stuck-at Faults in Random Access Memories
Authors:
- HartmannHAHartmann
- 1 November 1977
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Computers
- Vol. C-26 (11) , 1141-1144
Abstract
This correspondence presents an optimal algorithm to detect any single "stuck-at-i," "stuck-at-O" fault and any combination of "stuck-at-I," "stuck-at-O" multiple faults in a random access memory using only the n-bit memory address register input and m-bit memory buffer register input and output lines. It is shown that this algorithm requires 4 X 2n memory accesses.Keywords
This publication has 4 references indexed in Scilit:
- An Algorithm for Testing Random Access MemoriesIEEE Transactions on Computers, 1977
- Diagnosis & Reliable Design of Digital Systems1976
- Detection oF Pattern-Sensitive Faults in Random-Access MemoriesIEEE Transactions on Computers, 1975
- Fault location in memory systems by program1969