Influence of the setback of backgrounds behind semi-transparent synthetic targets on the accuracy of reflectorless distance measurements

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Abstract
Reflectorless distance measurements to synthetic materials are subjected to errors result from their partial transparency. The final reflection of the beam is from the background behind the synthetic. This paper examines the influence of the background setback on the accuracy of the measured distances for synthetics of various properties. The tests demonstrated a variable dependence of the measured distances on the setback of the background. For materials with a lower transparency, the errors were systematically decreasing as the background was being moved away. For the materials with a higher transparency, the errors initially increased and then they got systematically smaller.
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  • AGH University of Science and Technology (11.11.150.005)

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