Time-dependent hole and electron trapping effects in SIMOX buried oxides
Authors:
- H.E. BoeschHBH.E. Boesch
- T.L. TaylorTTT.L. Taylor
- L.R. HiteLHL.R. Hite
- W.E. BaileyWBW.E. Bailey
- 1 December 1990
- journal article
- research article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Nuclear Science
- Vol. 37 (6) , 1982-1989
Abstract
No abstract availableThis publication has 19 references indexed in Scilit:
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