Surface characterization by X-ray photoelectron spectroscopy and cyclic voltammetry of products formed during the potentiostatic reduction of chalcopyrite
Authors:
- Ignacio GonzálezIGIgnacio González
- Dietmar LeinenDLDietmar Leinen
- José R. Ramos-BarradoJRJosé R. Ramos-Barrado
- 1 May 2008
- journal article
- Published by Elsevier in Electrochimica Acta
- Vol. 53 (14) , 4889-4899
Abstract
No abstract availableKeywords
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