Various interferometric and fringe projection techniques may result in crossed and closed fringe patterns with the information about the phenomena tested. Recent applications require the analysis on the basis of a single fringe pattern. Here, we address two problems: simultaneous analysis of the information about two events, and analysis of fringe pattern with high phase gradients in both x and y directions. The analysis of a fringe pattern is performed by the spatial-carrier phase-shifting method used sequentially for x and y sampling directions. The error analysis of the method in reference to both problems is presented.