XPS and DFT study of pulsed Bi-implantation of bulk and thin-films of ZnO—The role of oxygen imperfections
Authors:
- D.A. ZatsepinDZD.A. Zatsepin
- D.W. BoukhvalovDBD.W. Boukhvalov
- N.V. GavrilovNGN.V. Gavrilov
- E.Z. KurmaevEKE.Z. Kurmaev
- I.S. ZhidkovI.S. Zhidkov
- 1 November 2016
- journal article
- Published by Elsevier in Applied Surface Science
- Vol. 387, 1093-1099
Abstract
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Funding Information
- Ministry of Education and Science of the Russian Federation (3.1016.2014/K)
- Russian Science Foundation (14-22-00004)
- Government Council on Grants, Russian Federation
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