Testing the robustness of two-boundary control policies in semiconductor manufacturing
Authors:
- Houmin YanHYHoumin Yan
- S. LouSLS. Lou
- S. SethiSSS. Sethi
- A. GardelAGA. Gardel
- P. DeosthaliPDP. Deosthali
- 1 May 1996
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Semiconductor Manufacturing
- Vol. 9 (2) , 285-288
Abstract
No abstract availableThis publication has 10 references indexed in Scilit:
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