No-fault-found and intermittent failures in electronic products
Authors:
- Haiyu QiHQHaiyu Qi
- Sanka GanesanSGSanka Ganesan
- Michael PechtMichael Pecht
Top Cited Papers
- 1 May 2008
- journal article
- Published by Elsevier in Microelectronics Reliability
- Vol. 48 (5) , 663-674
Abstract
No abstract availableKeywords
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