Relation Between Deposition Parameters, Structure and Raman Spectra of Carbon Overcoats on Simulated Magnetic Storage Discs
Authors:
- 1 January 1993
- journal article
- research article
- Published by Taylor & Francis in Tribology Transactions
- Vol. 36 (1) , 19-26
Abstract
Raman spectra of carbon overcoats of simulated hard magnetic storage discs were obtained for different conditions of deposition by argon ion-induced sputtering. Both an increase of substrate temperature and of argon ion pressure improved the spectral resolution of the two major Raman peaks, one at 1360 cm-1 (the so-called D peak) and one at 1580 cm-1 (the so-called G peak). By fitting these bands to Lorentzian contours and determining their separation it is possible to develop a quality factor from the spectra, which can be empirically related to performance in a disc drive.Keywords
This publication has 6 references indexed in Scilit:
- Raman scattering from extremely thin hard amorphous carbon filmsJournal of Applied Physics, 1987
- Raman Spectroscopy1987
- Use of Raman scattering to investigate disorder and crystallite formation in as-deposited and annealed carbon filmsPhysical Review B, 1984
- First- and second-order Raman scattering from finite-size crystals of graphitePhysical Review B, 1979
- Raman Spectrum of GraphiteThe Journal of Chemical Physics, 1970
- Raman Spectrum of Single-Domain BaTiPhysical Review B, 1968