A swept two-frequency microwave reflectometer for edge density profile measurements on TFTR

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1 October 1992

journal article
Published by AIP Publishing in Review of Scientific Instruments

Vol. 63 (10) , 4658-4660
DOI:10.1063/1.1143654

Abstract

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This publication has 1 reference indexed in Scilit:

X-mode broadband reflectometric density profile measurements on DIII-D
Review of Scientific Instruments, 1990