DEFECT CHARACTERIZATION USING TWO-DIMENSIONAL ARRAYS
Authors:
- P. D. WilcoxPWP. D. Wilcox
- Donald O. ThompsonDTDonald O. Thompson
- Dale E. ChimentiDCDale E. Chimenti
- 1 January 2011
- conference paper
- Published by AIP Publishing in AIP Conference Proceedings
- Vol. 1335 (1) , 835-842
Abstract
2D arrays are able to ‘view’ a given defect from a range of angles leading to the possibility of obtaining richer characterization detail than possible with 1D arrays. In this paper a quantitative comparison of 2D arrays with different element layouts is performed. A technique for extracting the scattering matrix of a defect from the raw 2D array data is also presented. The method is tested on experimental data for characterization of various volumetric defects.Keywords
Funding Information
- Engineering and Physical Sciences Research Council (EP/F005032/1)