HAXPES and XPS reference spectra of bulk semimetallic HgTe with Al Kα and Cr Kα monochromatic sources

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Abstract
Monochromatic Al Kα (1486.6 eV) and monochromatic Cr Kα (5414.8 eV) radiation sources were used to acquire x-ray photoelectron spectroscopy (XPS) and hard x-ray photoelectron spectroscopy (HAXPES) data on bulk semimetallic HgTe. The reported spectra include survey scans, high-resolution core-level spectra of Hg and Te, and x-ray-excited Auger transitions. These data provide reference binding and kinetic energy values and are intended to support future XPS and HAXPES studies of HgTe and related materials.
Funding Information
  • European Research Council (101086358)
  • Agence Nationale de la Recherche (ANR-22-CE09-0018)
  • Agence Nationale de la Recherche (ANR-22-CE09-0037-01)
  • Agence Nationale de la Recherche (ANR-23-CE50-0025)
  • Agence Nationale de la Recherche (ANR-24-ASM1-0001)
  • Agence Nationale de la Recherche (ANR-24-CE42-2757)
  • Agence Nationale de la Recherche (ANR-24-CE09-0786)
  • Agence Nationale de la Recherche (ANR-25-CE08-5762-02)
  • Agence Nationale de la Recherche (ANR-25-CE09-3398)
  • Centre National de la Recherche Scientifique (WITHIN)
  • Région Ile-de-France (INSIDE)