Energy loss measurement for charged particles in very thin silicon layers
Authors:
- S MeroliSMS Meroli
- D PasseriD Passeri
- L ServoliLSL Servoli
- 1 June 2011
- journal article
- Published by IOP Publishing in Journal of Instrumentation
- Vol. 6 (06) , P06013
Abstract
No abstract availableKeywords
This publication has 17 references indexed in Scilit:
- The ATLAS silicon microstrip tracker. Operation and performanceJournal of Instrumentation, 2010
- Commissioning and performance of the CMS pixel tracker with cosmic ray muonsJournal of Instrumentation, 2010
- PAMELA sub-detectors capability in light nuclei identificationJournal of Physics: Conference Series, 2010
- THE LARGE AREA TELESCOPE ON THEFERMI GAMMA-RAY SPACE TELESCOPEMISSIONThe Astrophysical Journal, 2009
- The ALICE experiment at the CERN LHCJournal of Instrumentation, 2008
- Performance study of new pixel hybrid photon detector prototypes for the LHCb RICH countersIEEE Transactions on Nuclear Science, 2004
- Passage of particles through matterThe European Physical Journal C, 2000
- Random and channeled energy loss in thin germanium and silicon crystals for positive and negative 2-15-GeV/cpions, kaons, and protonsPhysical Review B, 1978
- Straggling of Heavy Charged Particles: Comparison of Born Hydrogenic-Wave-Function Approximation with Free-Electron ApproximationPhysical Review B, 1970
- Zum Energieverlust schneller Elektronen in d nnen SchichtenThe European Physical Journal A, 1950