Functional tests for arbitration SRAM-type FIFOs
Authors:
- A.J. van de GoorAGA.J. van de Goor
- Y. ZorianYZY. Zorian
- 2 January 2003
- conference paper
- Published by Institute of Electrical and Electronics Engineers (IEEE)
- p. 96-101
Abstract
No abstract availableThis publication has 5 references indexed in Scilit:
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