Improving creep resistance of Al-0.27Zr-0.08Sn (wt%) via cold swaging while maintaining high electrical conductivity
Authors:
- Ismael E. CoelloICIsmael E. Coello
- Sumit BahlSBSumit Bahl
- Jie QiJQJie Qi
- Lawrence F. AllardLALawrence F. Allard
- Chris M. FancherChris M. Fancher
- Amit ShyamASAmit Shyam
- David C. DunandDDDavid C. Dunand
- 24 July 2026
- journal article
- Published by Elsevier in Materials Science and Engineering: A
- Vol. 974
Abstract
No abstract availableFunding Information
- Oak Ridge National Laboratory
- Northwestern University
- Office of Energy Efficiency and Renewable Energy
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