The origin of mechanical stress in vacuum-deposited MgF2 and ZnS films
Authors:
- H.K. PulkerHPH.K. Pulker
- J. MäserJMJ. Mäser
- 1 April 1979
- journal article
- Published by Elsevier in Thin Solid Films
- Vol. 59 (1) , 65-76
Abstract
No abstract availableKeywords
This publication has 7 references indexed in Scilit:
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- Stress in Epitaxed and Randomly Oriented Films of Ag, Cu and Au on MicaJapanese Journal of Applied Physics, 1974
- Correlation between film structure and sorption behaviour of vapour deposited ZnS, cryolite and MgF2 filmsThin Solid Films, 1972
- An investigation of the evaporation process of dielectric materialsThin Solid Films, 1969
- Influence of Substrate Temperature on the Condensation of Vacuum Evaporated Films of MgF2 and ZnSJournal of Vacuum Science and Technology, 1969
- Stresses Developed in Optical Film CoatingsApplied Optics, 1966
- Calculation of stress in electrodeposits from the curvature of a plated stripJournal of Research of the National Bureau of Standards, 1949