Single photon imaging X-ray spectrometers using low noise current preamplifiers with dc voltage bias
Authors:
- S. FriedrichSFS. Friedrich
- K. SegallKSK. Segall
- M.C. GaidisMGM.C. Gaidis
- C.M. WilsonCWC.M. Wilson
- D.E. ProberDPD.E. Prober
- P.J. KindlmannPKP.J. Kindlmann
- A.E. SzymkowiakASA.E. Szymkowiak
- S.H. MoseleySMS.H. Moseley
- 1 June 1997
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Applied Superconductivity
- Vol. 7 (2) , 3383-3386
Abstract
No abstract availableThis publication has 6 references indexed in Scilit:
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