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Experimental Techniques for Low-Temperature Measurements: Cryostat Design, Material Properties, and Superconductor Critical-Current Testing
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Experimental Techniques for Low-Temperature Measurements: Cryostat Design, Material Properties, and Superconductor Critical-Current Testing
Experimental Techniques for Low-Temperature Measurements: Cryostat Design, Material Properties, and Superconductor Critical-Current Testing
Author:
GZ
George O. Zimmerman
George O. Zimmerman
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1 May 2007
journal article
Published by
AIP Publishing
in
Physics Today
Vol. 60
(5)
,
67-68
DOI:
10.1063/1.2743130
Abstract
No abstract available
Cited
Cited by 12 articles
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