Method for measurement of the directional/hemispherical reflectance of photovoltaic devices
- 4 December 2000
- journal article
- research article
- Published by Elsevier in Optics Communications
- Vol. 186 (1-3) , 1-14
Abstract
No abstract availableKeywords
This publication has 4 references indexed in Scilit:
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- Non-destructive optical characterization of photovoltaic modules by an integrating sphere.Optics Communications, 1999
- 19.8% efficient “honeycomb” textured multicrystalline and 24.4% monocrystalline silicon solar cellsApplied Physics Letters, 1998
- Reflectance Spectroscopy1969